Apparatuses for Photothermal Refraction

UNDIFFRACTED

PROBE

SAMPLE

DETECTOR

EXCITATION

LASERS

PROBE

LASER

PROBE

LASER

SAMPLE

PINHOLE

EDGE

DETECTOR

INDEX

CHANGE

SAMPLE

INTERFEROMETRY

DEFLECTION

DIFFRACTION

MIRROR

PROBE

LASER

OPTICAL

EXCITATION

INDEX

CHANGE

LENSING

OPTICAL

EXCITATION

SAMPLE

INDEX

CHANGE

MIRROR

OPTICAL

EXCITATION

DETECTOR

INDEX

GRATING

DETECTOR

PROBE

LASER

• Interferometry: Refractive index change produces an optical phase shift

• Deflection: Probe laser direction change due to index gradient

• Lensing: Probe laser blooming due to curved index change

• Diffraction: Probe laser scattering due to periodic index change

Previous slide

Next slide

Back to first slide

View graphic version